Upcoming Events

MicroLED Connect 2026 will bring together participants from across the global MicroLED industry. The event will feature a world-class agenda, dynamic exhibition, industry-led masterclasses, and guided tours of relevant state-of-the-art local centres and facilities.

The event will also be co-located with AR/VR Connect, creating additional opportunities for connection across related display and immersive technology sectors.

Join us at booth #620 for the 52nd International Symposium for Testing and Failure Analysis (ISTFA) which is set to take place in San Antonio, Texas, from October 4-8, 2026. As the premier event for the microelectronics failure analysis community, ISTFA brings together leading experts, industry professionals, and researchers to share insights, innovations, and methodologies in the field. Attendees will engage in a comprehensive program that includes keynote presentations, technical sessions, workshops, and networking opportunities, all designed to foster collaboration and knowledge exchange.

Join us at booth #3219 as SEMICON West returns to San Francisco, bringing together the world’s leading semiconductor companies, technology innovators, policymakers, engineers, researchers, and business leaders driving the future of microelectronics.

From AI and advanced packaging to smart manufacturing, sustainability, mobility, MedTech, and workforce development, SEMICON West is where the industry comes together to solve challenges, accelerate innovation, and build strategic partnerships.

Experience:

• Visionary keynote presentations from global industry leaders 
• Cutting-edge technology and product showcases 
• Expert-led programs across today’s most critical industry topics 
• High-value networking with decision-makers from across the supply chain 
• Workforce and talent development initiatives shaping the future of the industry 

Join the conversations and collaborations transforming tomorrow. Register now to secure your pass and be part of the industry's most influential gathering.