Join us at booth #620 for the 52nd International Symposium for Testing and Failure Analysis (ISTFA) which is set to take place in San Antonio, Texas, from October 4-8, 2026. As the premier event for the microelectronics failure analysis community, ISTFA brings together leading experts, industry professionals, and researchers to share insights, innovations, and methodologies in the field. Attendees will engage in a comprehensive program that includes keynote presentations, technical sessions, workshops, and networking opportunities, all designed to foster collaboration and knowledge exchange.