ISTFA - Nov 16-20, 2025
Intlvac Thin Film to Exhibit Nanoquest Ion Beam Etch Systems at ISTFA 2025
Intlvac Thin Film is pleased to announce our participation in ISTFA 2025, the 51st International Symposium for Testing and Failure Analysis, taking place November 16–20 in Pasadena, California,
As the premier event for the microelectronics failure analysis community, ISTFA brings together leaders in semiconductor reliability, advanced packaging, and heterogeneous integration. Intlvac will be showcasing our Nanoquest series of Ion Beam Etch (IBE) systems, designed for high-precision material removal across a range of applications—from failure analysis to device development and packaging.
Our broad beam IBE platforms deliver superior etch uniformity, process control, and flexibility, making them ideal tools for addressing the complex challenges of next-generation microelectronics.
Visit our booth to explore how Intlvac’s ion beam technology can support your analytical and fabrication workflows in an era of rapidly evolving device architectures.